Shuttle test delay
نویسندگان
چکیده
منابع مشابه
Hierarchical Delay Test Generation
Delay testing is used to detect timing errors in a digital circuit. In this paper, we report a tool called MODET for automatic test generation for path delay faults in modular combinational circuits. Our technique uses precomputed robust delay tests for individual modules to compute robust delay tests for the module-level circuit. We present a longest path theorem at the module level of abstrac...
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ژورنال
عنوان ژورنال: Nature
سال: 1987
ISSN: 0028-0836,1476-4687
DOI: 10.1038/329003d0